Abstract
AbstractA detailed characterization of the underlying and adjacent soils near a chrome plating shop utilized field‐portable X‐ ray fluorescence (XRF) as a screening tool. XRF permitted real‐time acquisition of estimates for total metal content of soils. A trailer‐mounted soil coring unit was used to recover soil samples for XRF analyses. This approach minimized the number of samples required for adequate characterization of the chromium distribution in the soils at the site and permitted immediate delineation of source‘hot spots.’The nondestructive nature of the XRF analyses permitted correlation analysis using inductively coupled plasma (ICP) techniques. Correlation between XRF and ICP was very good (r2= 0.95) but the XRF analyses underestimated the total chromium concentrations, probably because of inappropriate calibration samples.
Published Version
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