Abstract
In this paper, we study the relationship of local birefringence and stress oriented inhomogeneous elasticity of a sample from the spatial frequency response of focused surface plasmon (FSP). The birefringence of the sample varies the propagation constant of surface plasmon with regard to its direction and produces an elliptic absorption pattern in the reflected spatial frequency distribution. Birefringence is calculated from the ratio of the propagation constant along the fast to slow axis of the sample. The change in eccentricity was proportional to the applied stress on cellophane film. A strong correlation (0.94∼0.97) exists between FSP and phase shifting interferometry results.
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