Abstract
The objective of this work is to analyze the effects of argon ion irradiation process on the structure and distribution of Te inclusions in Cd1-xZnxTe crystals. The samples were treated with different ion fluences ranging from 2 to 8×1017cm−2. The state of the samples before and after irradiation were studied by Scanning Electron Microscopy (SEM), Atomic Force Microscopy (AFM), Cathodoluminescence, Photoluminescence, and micro-Raman spectroscopy. The effect of the irradiation on the surface of the samples was clearly observed by SEM or AFM. Even for small fluences a removal of polishing scratches on the sample surfaces was observed. Likely correlated to this effect, an important enhancement in the luminescence intensity of the irradiated samples was observed. An aggregation effect of the Te inclusions seems to occur due to the Ar bombardment, which are also eliminated from the surfaces for the highest ion fluences used.
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