Characterization of bulk superconductors through EBSD methods

Abstract

The application of electron backscatter diffraction (EBSD) technique to bulk high- T c superconductors is presented and reviewed. Due to the ceramic nature and the complex crystallographic unit cells of the perovskite-type high- T c superconductors, the EBSD analysis is not yet as common as it deserves. We have successfully performed EBSD analysis on a variety of high- T c compounds and samples including polycrystalline YBCO (pure and doped by alkali metals), melt-textured YBCO, thin and thick films of YBCO; the “green phase” Y 2BaCuO 5, thin film and melt-textured NdBa 2Cu 3O x and Bi-2212 single crystals and tapes. It is shown that the surface preparation of the samples is crucial due to the small information depth (up to 100 nm) of the EBSD technique. High quality Kikuchi patterns are the requirement in order to enable the automated EBSD mapping, which yields phase distributions, individual grain orientations and the misorientation angle distribution. The results can be presented in form of mappings, as charts, and as pole figures. These informations are required for a better understanding of the growth mechanism(s) of bulk high- T c superconductors intended for applications.