Characterization of an NTD Double-Sided Silicon Strip Detector Employing a Pulsed Proton Microbeam

Abstract

Monoenergetic pulsed proton beams at energies of 1 and 3 MeV per proton have been employed to characterize a segmented double-sided silicon strip detector. The detector is manufactured from a neutron transmutation doped silicon wafer and features a bulk resistivity of $2300~\Omega \cdot \text {cm}$ . Signals from both P-side and N-side strips have been digitized at 14 b, 100 MS/s. The beam was focused either in the middle of one strip or on the gap in between two strips. Energy resolution, charge collection time, and interstrip effects (charge sharing, charge losses, and inverted polarity pulses) have been investigated at different bias voltages and for particles entering either from the junction side or from the ohmic side.