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Abstract
The capability to generate up to 1 V pure AC signals based on quantum standards marked a milestone on electrical metrology opening new applications that were not possible without this standard. Frequency response characterization of analog-to-digital converters (ADC) is fundamental for precision digital metrology. Several methods have been investigated for this characterization based on thermal converters, programmable Josephson voltage standard or input impedance measurements. This paper describes the method, the results obtained and the uncertainty estimation for the characterization of the amplitude frequency response at different aperture times of the DCV sampling function of the Keysight 3458-A using, for the first time, a Josephson arbitrary waveform synthesizer. This new standard allows one to extend the characterization to a higher frequency range and lower aperture times. The results show that the frequency response does not depend on aperture time and the same frequency correction can be applied in an extended frequency range. The knowledge of this correction will facilitate the application of the ADCs to higher frequencies, where low aperture times are required with accuracy in the order of V/V.
Highlights
Since more than 60 years ago the AC voltage and current reference have been related to the DC values by transfer techniques mainly based on thermal converters
There is no difference between the results obtained from the sine-wave fitting algorithm and those obtained from the artificial neural network
In the following evaluation the method is not distinguished. It is specified by the manufacturer of the Keysight 3458-A and have been reported in several papers [6, 7, 16], that there is a change in the digital multimeter (DMM) internal configuration for aperture times above and below 100 μs that modifies its input impedance, resulting in two distinctly different regions in the frequency response
Summary
Since more than 60 years ago the AC voltage and current reference have been related to the DC values by transfer techniques mainly based on thermal converters. These techniques are in use at the National Metrology Institutes (NMIs) and at high-level calibration laboratories. Are able to provide the necessary accuracy, at the ppm level and for some voltage, 1 V–3 V, and frequencies, 20 Hz– 100 kHz, to the sub-ppm level. Despite their accuracy, they are limited to provide only root mean square (RMS) values. Most of the instrumentation is based on sensors that convert any quantity into an electrical signal related
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