Characterization of a New Low Temperature Encapsulation Method with Ethylene-Vinyl Acetate under UV Irradiation for Perovskite Solar Cells

Abstract

In this work, the performance of a new ethylene-vinyl acetate-based low temperature encapsulation method, conceived to protect perovskite samples from UV irradiation in ambient conditions, has been analyzed. To this purpose, perovskite samples consisting of a set of MAPbI3 (CH3NH3PbI3) films and MAPbI3 with an ETL layer were deposited over glass substrates by spin-coating techniques and encapsulated using the new method. The samples were subjected to an UV lamp or to full solar irradiation in ambient conditions, with a relative humidity of 60–80%. Microscope imaging, spectroscopic ellipsometry and Fourier-transform infrared spectroscopy (FTIR) techniques were applied to analyze the samples. The obtained results indicate UV energy is responsible for the degradation of the perovskite layer. Thus, the cut-UV characteristics of the EVA encapsulate acts as an efficient barrier, allowing the laminated samples to remain stable above 350 h under full solar irradiation compared with non-encapsulated samples. In addition, the FTIR results reveal perovskite degradation caused by UV light. To extend the study to encompass whole PSCs, simulations were carried out using the software SCAPS-1D, where the non-encapsulated devices present a short-circuit current reduction after exposure to UV irradiation, while the encapsulated ones maintained their efficiency.