Abstract
The imogolite composites in which Si was substituted by Ge (Ge-substituted imogolite) were prepared from a concentrated solution with dissolved GeOz and were characterized by using atomic force microscopy, IR and Raman spectroscopy. IR and Raman spectra of these materials are the same as previous results prepared from a dilute inorganic solution. Thermal transformation of Ge-substituted imogolite was investigated by using thermal analysis, A1 solid-state nuclear magnetic resonance and X-ray diffraction. Two endothermic peaks (110°C and 400°C) and an exothermic peak (906°C) were shown by differential thermal analysis. Ge-substituted imogolite changed into an amorphous phase by dehydration and transformed Al6Gez013 crystals at ca. 900°C. A12Gez07 crystals were formed as a new phase at 1300°C from Ge-substituted imogolite.
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