Abstract
Titanium aluminum nitride (TiAlN) ternary coating is a potential material which is expected to be applied on satellite for thermal controlling. In order to investigate thermal controlling property, TiAlN coatings were deposited on Si wafers with different N 2 and Ar flux ratio by reactive magnetron co-sputtering. The structure, morphology, chemical composition and optical reflectance are investigated by X-ray diffraction (XRD), field emission scanning electron microscope (FE-SEM), atom force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) and spectrophotometer, respectively. The orientation of the coatings depends on the N 2/Ar flux ratio. The coatings deposited with N 2/Ar ratio of 10, 30 and 60% show the cubic-TiN [2 2 0] preferred orientation and the coating deposited with N 2/Ar ratio of 100% exhibits the phase of hexagonal-AlN and cubic-TiN. The surface of the coatings becomes more compact and smoother with the N 2/Ar ratios increase. XPS spectrum indicates that the oxides (TiO 2 and Al 2O 3), oxynitride (TiN x O y ) and nitrides (TiN and AlN x ) appear at the surface of the coatings. Ignoring internal power, the optimum equilibrium temperature of TiAlN coatings is 18 °C and the equilibrium temperature after heat-treated has slight change, which provides the prospective application on thermal controlling.
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