Abstract
In present work, tin-pigmented alumina (Sn-Al2O3) solar absorber on the aluminium substrate was successfully prepared by anodic anodization and further characterized by different methods. The phase, morphology, reflectance (R) and thermal conductivity of the Sn-Al2O3 solar absorber were measured by X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM) equipped with energy dispersive X-ray (EDX) analyzer, and Ultraviolet-visible-near infrared spectrophotometer in the wavelength of 300-2500 nm. The solar absorptance (α) was calculated based on the relationship of the spectral reflectance, R(λ), and the solar spectral irradiance of AM 1.5, Is(λ), in the wavelength interval of 300-2500 nm. As the results, the surface color of the Sn-Al2O3 film was dark-black color. The XRD pattern of Sn-Al2O3 films was indexed as aluminium and tin phases. The chemical composition of the Sn-Al2O3 films composed of tin (Sn), aluminum (Al) and oxygen (O) elements. The average thickness of the produced films was 18.9 μm. It was found that Sn-Al2O3 films showed the low R (0.09) and high α (0.93) values for the whole wavelength 300-2500 nm, corresponding to theoretical properties of the solar absorber. Therefore, it can be concluded that the Sn-Al2O3 film on aluminium substrate can be applied to be the solar absorber in solar collector due to high α, which is similar to the commercial solar absorbers.
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