Abstract
In this research, zinc oxide (ZnO) films were prepared using a wet chemical reaction via a microwave technique. X-ray diffraction techniques (XRD) and energy dispersive x-ray spectroscopy (EDS) were used to study the phases, crystalline structures, chemical compositions and optical properties of the films, respectively. Optical transmittance was also measured through UV-VIS spectroscopy. Surface film morphologies were investigated by scanning electron microscopy (SEM). As a result, a ZnO phase with a hexagonal structure was detected. The EDS spectrum shows that elements of Zn and O were present. The average optical transmittance value for all films was 75% at a wavelength of 370-375 nm, a comparison among the films obtained at different times show a transmittance value slightly higher for films obtained at higher times. A calculation of the energy band gap of ZnO films was estimated to be in the range of 3.31 to 3.35 eV. Additional, the ZnO films showed a smooth surface.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
