Characterization and integration of polymeric and microdiffraction specimens using a two-dimensional position-sensitive detector

Abstract

An automated x-ray diffraction system configured with a two-dimensional position sensitive detector (PSD) was used to characterize both polymeric and microdiffraction specimens. Pinhole collimation and an incident beam monochromator were used for the polymer applications, while dual nickel coated x-ray mirrors were used to focus and monochromatize the x-ray beam for microdiffraction experiments. Radial and azimuthal integration techniques automatically convert the two-dimensional PSD data into a traditional powder pattern for data manipulation. The complete or partial Debye ring(s) of a diffraction pattern can be imaged simultaneously with the Siemens two-dimensional PSD. For polymeric specimens this allows data to be collected rapidly (in seconds) and in digital form eliminating cumbersome film techniques. The integration over a large section of the Debye ring(s) also enhances the diffracted beam detectability making this system sensitive for microdiffraction experiments.