Characteristics of the layered film structure of high-Tc superconducting Bi systems

Abstract

Superconducting multilayers and junctions using thin films of Bi systems were prepared by a multitarget RF magnetron sputtering technique. The surface morphology, crystallization, diffusion and layered structures of these thin films were evaluated by TEM, AES, SIMS and X-ray diffraction measurements. The Josephson characteristics were confirmed on S(BSCCO)/N(BSNCO)/S(BSCCO) thin films. Magnetic field measurements were performed on the multilayers. The superconducting properties such as a change of Tc, a broadening of the transition and anisotropy were discussed.