Abstract
For the first time, the highly transparent yellow Ce:YAG scintillation crystal with a diameter of 3 in has been grown by the temperature gradient technique (TGT). The segregation coefficient of Ce ions in 0.8at% doped TGT-Ce:YAG crystal determined by the ICP-AES method was 0.082, and the Ce distribution along the [1 1 1] growth axis was also investigated. The main macroscopic defects such as striations, side cores, bubbles, inclusions and stress birefringence were observed in as-grown Ce:YAG crystal by means of cross-polarized light microscope observation. The results show that the main defects such as bubbles, inclusions and stress birefringence mainly existed near the crystal peripheral edges.
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