Abstract
The flux noise in a long superconducting quantum interference device (SQUID) array consisting of at least 100 dc-SQUID elements connected in series was characterized analytically, and then compared with measurements. In the analysis, noise sources in the array were shunt resistors for Josephson junctions, a damping resistor for a SQUID loop, the dynamic resistance of the SQUID array, and the noise of electronics at room temperature. The flux noise of the array was calculated analytically as a function of the number of dc-SQUID elements. The results reveal that the flux noise is significantly influenced by the dynamic resistance of the array, although the influence by the dynamic resistance for a single SQUID is negligibly small. The dynamic resistance becomes dominant for the flux noise when the number of SQUID elements in the array exceeds 100. These results agree well with the measured flux noise for a long SQUID array constructed using a Nb/AlOx/Nb fabrication process.
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