Abstract
Generation current margin is found to be limited not only by minimum current but also by maximum current. The generator maximum current I <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Gmax</inf> is measured for a 64 Kbit bubble memory chip with a 3 micron bubble. The chip temperature range was from 0 °C to 70 °C. A considerable loss of current margin is found at high current and high temperatures. This is considered to result from the generation of extra bubbles. I <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Gmax</inf> and its decay are observed to strongly depend on the shape of the generation pulse. A properly selected pulse shape increases I <inf xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Gmax</inf> by 100 mA for a margin decay of less than -4 mA/decade and generate operation becomes possible in wide temperature range without compensation. Design combinations of generator and transfer gate or generator and replicator are proposed to give a more reliable generator port.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
