Abstract
Over the past few years, intense effort has been expended on studying the physical processes responsible for the production of characteristic X-rays during heavy ion/atom collisions. It is considered timely at this stage to assess one of the applications of this work, viz., the use of heavy ions to detect elements at or near to surfaces. It emerges that one of the advantages of the technique is its ability to detect light elements with high sensitivity and to examine the depth distribution of implanted elements. As an example of its application, evidence is presented for the detection of sulphur on the surfaces of copper, nickel and stainless steel.
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