Abstract
Over the past few years, intense effort has been expended on studying the physical processes responsible for the production of characteristic X-rays during heavy ion/atom collisions. It is considered timely at this stage to assess one of the applications of this work, viz., the use of heavy ions to detect elements at or near to surfaces. It emerges that one of the advantages of the technique is its ability to detect light elements with high sensitivity and to examine the depth distribution of implanted elements. As an example of its application, evidence is presented for the detection of sulphur on the surfaces of copper, nickel and stainless steel.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.