Abstract
Imprint refers to a degradation mechanism in ferroelectrics. We studied effects of imprint in poly(vinylidene-trifluoroethylene) metal-ferroelectric-metal capacitors and found a common functional time dependence of imprint properties. The coercive field, the switching time, the permittivity, and the remanent dielectric displacement change linearly as a function of the logarithm of time after a ferroelectric polarization reversal. These changes were found to be independent of the sample thickness. Therefore, we propose imprint to be caused by mechanisms in the bulk of the ferroelectric. We additionally present by means of a feedback model based on a Weiss mean field approach a correlation between the change of the ferroelectric switching time and the change of the coercive voltage.
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