Abstract
The applicability of X-ray radiation for the observation of accelerated particle beam profiles is studied. Three types of quasi-monochromatic X-ray radiation excited by the particles in crystals are considered: characteristic X-ray radiation, parametric X-ray radiation, diffracted transition X-ray radiation. Radiation is collected at the right angle to the particle beam direction. It is show that the most intensive differential yield of X-ray radiation from Si crystal can be provided by characteristic radiation at incident electron energies up to tensMeV, by parametric radiation at incident electron energies from tens to hundredsMeV, by diffracted transition X-ray radiation at GeV and multi-GeV electron energies. Therefore these kinds of radiation are proposed for application to beam profile observation in the corresponding energy ranges of incident electrons. Some elements of X-ray optics for observation of the beam profile are discussed. The application of the DTR as a source of powerful tunable monochromatic linearly polarized X-ray beam excited by a multi-GeV electron beam on the crystal surface is proposed.
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