Characteristic energy losses in layered metallic thin films

Abstract

Characteristic electron energy loss spectra of layered films of Bi-Mg have been measured and a new loss has been found at 12.9 ± 0.2 eV. This loss can be interpreted as a surface plasma loss at the metal-metal interface. A surface loss in Al-Mg films was not reproducible, but a new loss was observed at 26.4 eV which can be interpreted as a single Al loss (15.4 eV) plus a single Mg loss (10.9 eV).