Characterisation of Ni+ implanted PEEK, PET and PI

Abstract

Polyimide (PI), polyetheretherketone (PEEK) and polyethyleneterephthalate (PET) were implanted with 40keV Ni+ ions at room temperature at fluences ranging from 1.0×1016 to 1.5×1017ionscm−2 and with ion current density varying between 4 and 10μAcm−2. The depth profiles of the implanted Ni atoms determined by the RBS technique were compared with those predicted by the SRIM and TRIDYN codes. Hydrogen depletion as a function of the ion fluence was determined by the ERDA technique, and the compositional and structural changes of the polymers were characterised by the UV–vis and XPS methods. The implanted profiles differed significantly from those predicted by the SRIM code while the lower fluences were satisfactorily described by the TRIDYN simulation. A significant hydrogen release from the polymer surface layer was observed along with significant changes in the surface layer composition. The UV–vis results indicated an increase in the concentration and conjugation of double bonds.