Abstract
Transmission X-Ray topography (X-ray imaging) was used to characterize the density and type of the native dislocations in ZnO substrates. C-oriented ZnO bulk materials from different origins were compared, either high purity Chemical Vapor Transport (CVT) grown or commercial, hydrothermally grown wafers. Elongated dislocations lying within the substrate were found in hydrothermal substrates. In CVT crystals, the density of dislocations was found to be too high for X-ray determination of their Burgers vector. However, in hydrothermal crystals, the density of dislocations were found to be in the range < 104 / cm2 and extend mainly within the substrate. Whereas complete Burgers vector identification is not achieved, two kinds of dislocations have been evidenced : grown-in, swirled dislocations ("high" temperature) and linear, gliding dislocations, most probably developped during the cooling steps in (0 1–1 0) glide planes.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.