Abstract
AbstractA replica‐mask method is presented to measure the contrast of character strokes on emissive displays under carefully controlled illumination. The method accounts for veiling glare introduced into the detector by the bright areas surrounding the dark characters. A sampling sphere is used to provide a uniform diffuse surround. Measurements of the diffuse reflectances are provided with specular included and with specular excluded. For emissive displays, the contrast depends both upon the darkroom characteristics of the emissive display and its reflective characteristics. Details are provided to replicate the measurement procedure.
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