Abstract
This chapter focuses on the aberration correction with the spherical aberration corrected transmission electron microscope (SACTEM)-toulouse. The benefits of aberration correction have been underestimated and largely unexpected. Aberration correction allows strain mapping to be performed on thick and damaged focused ion beam (FIB)-prepared specimens. The least expected benefits have been for electron diffraction experiments. Aberration correction allows large-angle convergent-beam electron diffraction (LACDIF) and convergent-beam electron holography (CHEF) configurations to be used effectively and efficiently. The extra lenses provided by the corrector allow original optical configurations to be explored. Indeed, the stability of the microscope and the computer-assisted alignment has allowed the SACTEM to be used continuously and routinely in a wide range of modes ever since its installation.
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