Chapter 3 - Surface Analyses of I–III–VI 2 Compounds

Abstract

Publisher Summary The chapter discusses the results on the I–III–VI 2 compounds, such as surface and crosssections of the absorbers recorded by atomic force microscope (AFM) and scanning electron microscopy (SEM). In addition, the composition, chemical states, grading, and depth profile studies by electron probe microanalysis (EPMA), secondary ion mass spectroscopy (SIMS), Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS) are explored by citing several examples. The AFM is one of the most powerful techniques to investigate the status of surface conditions of either thin film or single crystals, which are being to employ for solar cell applications. The EPMA that works on the principle of wavelength dispersive analysis of X-rays is one of the reliable analytical methods to determine the chemical composition of either thin film or minimum bulk weighing. The SIMS is one of the versatile techniques to assess the distribution of the elements in the thin film solar cell structure or absorber. In order to attain the chemical compositions of the layers/compounds by quantitatively, different kinds of methods have been employed in AES, such as the following: (1) utilization of published relative sensitivity factors, (2) calculation of sensitivity factor including matrix effects, (3) calibration with an Ag standard, and (4) calibration with identical ternary compounds. The XPS or electron stimulated chemical analysis (ESCA) plays a vital role to estimate the composition, thickness, and in particular chemical state of the compound.