Abstract
This chapter aims at reviewing the characterisation techniques that are commonly used for high temperature oxidation study, especially on stainless steels. In addition, the experimental studies about the high temperature oxidation i.e. thermogravimetric method and chromium volatilisation measurement are explained. The various kinds of characterisation techniques for physico-chemical and electronic properties of thermal oxide scales are reviewed, starting from optical microscopy (OM), scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy (EDS), focused ion beam coupled with scanning electron microscope (FIB/SEM), X-ray diffractometer (XRD), X-ray photoelectron spectroscopy (XPS), Raman spectroscopy (RS), and photoelectrochemical characterisation (PEC). The review focuses on the basic concepts and shows how the characterising tools can be applied to thermal oxide characterisation.
Highlights
In high temperature corrosion study, thermal oxide scales are interested in many aspects such as interfaces, morphologies, species, semiconducting types, and growth mechanisms, because they affect lifetime of material
The focused ion beam coupled with scanning electron microscope is the superior technique because the focused ion beam is used for the cross-sectioning preparation inside the vacuum chamber when the electron microscope is operated, allowing to reveal the information of matter from surface to the desired depth such as morphology [6,7]
Before venting the outlet gas to the atmosphere, the gas is flowed through the water-containing Erlenmeyer flask which is the second bubbler of the setup for making sure that all chromium volatile species are captured into the solution
Summary
In high temperature corrosion study, thermal oxide scales are interested in many aspects such as interfaces, morphologies, species, semiconducting types, and growth mechanisms, because they affect lifetime of material. The surface morphology of thermal oxide grown on alloy can be observed by optical microscope and scanning electron microscope. The focused ion beam coupled with scanning electron microscope is the superior technique because the focused ion beam is used for the cross-sectioning preparation inside the vacuum chamber when the electron microscope is operated, allowing to reveal the information of matter from surface to the desired depth such as morphology [6,7]. Photoelectrochemical technique, which is generally used for finding electronic characteristics of matter, can be applied to identify thermal oxide phases with a high performance and a superior local analysis [20, 21]. Apart from the characterisation techniques, the experimental methods for simulating oxidation conditions are important.
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