Abstract
This chapter discusses control charts as an important tool of statistical process control (SPC). They may be divided into two major groups: control charts for variables and control charts for attributes. Among the control charts for variables, we will study the control charts for the mean (X¯), for the range (R), and for the standard deviation (S). Among the control charts for attributes, we will study the p chart (defective fraction), the np chart (number of defective products), the c chart (total number of defects per unit), and the u chart (average number of defects per unit). Finally, to measure the process capability, we will study the main indexes: Cp, Cpk, Cpm, and Cpmk.
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