Abstract
The chapter describes the far infrared optical constants of a selection of alkali halide crystals, II-VI semiconductors, and III-V semiconductors determined by dispersive Fourier transform spectroscopy (DFTS). DFTS is a technique for determining the optical constants of materials in the solid, liquid, or gas phase, from direct measurements of the amplitude and phase reflection or transmission coefficients of suitable samples as a function of frequency or wave number. The chapter briefly summarizes the principles of the Fourier technique and concentrates on aspects of the method that have a direct bearing on the accuracy of the determination of the optical constants. It reviews the optical constants of a selection of simple binary solids calculated from amplitude and phase reflection coefficients determined by reflection DFTS. In DFTS, a suitable sample is usually prepared with plane-parallel surfaces, which is placed in one arm, usually the fixed arm, of a two-beam Michelson interferometer for measurements either in reflection or transmission.
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