Abstract
Publisher Summary This chapter focuses on the application of X-ray photoelectron spectroscopy (XPS) for characterizing clay and clay mineral surfaces. XPS is the single, most versatile technique for analyzing the surface composition of clay mineral particles under different chemical conditions. XPS can detect almost all elements in the surface layer with sensitivities not varying by two orders of magnitude and provide information on chemical bonding. An added advantage is that XPS is essentially nondestructive even for materials of high susceptibility. Thus, XPS can reveal differences in chemical composition between the surface and the bulk and assess changes in composition and chemical bonding because of surface interactions with other materials. XPS measures the kinetic-energy distribution of electrons (photoelectrons) emitted from core levels of the elements constituting a solid when the sample is irradiated by X-rays.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
