Chapter 11 Application to Single Specimens

Abstract

Publisher Summary This chapter discusses the applications of scanning electron microscope (SEM) and tunneling electron microscope (TEM) to single specimens. In the SEM, the focused beam impinges upon the surface of the specimen. The electron radiation is used for two synchronous scanning beams, one sweeping over the surface of the specimen, and a corresponding second one over a cathode ray tube, which is recorded with a camera. The micrograph thus obtained shows the surface features of the specimen. In the TEM, the image is formed by the electromagnetic lens and it is a measure of the scattering power of each point as the electron beam passes in the specimen, which is an ultrathin section. The image is magnified and can be displayed on a fluorescent screen. It is found that to obtain a micrograph, however, the beam is transmitted through the specimen, defocused below the specimen, and projected onto a photographic emulsion surface. Amalgamation of three-dimensional information obtained from the SEM and the TEM on the same sample would certainly result in the best possible representation of the sample.