Abstract
This chapter deals with small-angle light scattering (SALS) and small-angle X-ray scattering (SAXS) techniques. The importance of X-ray scattering over the X-ray diffraction techniques is discussed. It is well known that the diffraction of light from an object is due to the wave nature of light, whereas scattering is considered a phenomenon of the dual (both particle and wave) nature of light. Scattering is a wave interaction but diffraction is a wave propagation phenomenon. Developments in nanoscience and nanotechnology necessitate various techniques to characterize various nanomaterials. This chapter reviews the progress in characterizing nanomaterials with SALS and SAXS along with the fundamental working principles.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: Thermal and Rheological Measurement Techniques for Nanomaterials Characterization
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.