Chaos and related nonlinear noise phenomena in Josephson tunnel junctions

Abstract

The nonlinear dynamics of Josephson tunnel junctions shunted by a resistance with substantial self-inductance have been thoroughly investigated. The current-voltage characteristics of these devices exhibit stable regions of negative differential resistance. Very large increases in the low-frequency voltage noise with equivalent noise temperatures of 10/sup 6/ K or more, observed in the vicinity of these regions, arise from switching, or hopping, between subharmonic modes. Moderate increases in the noise, with temperatures of about 10/sup 3/ K, arise from chaotic behavior. Analog and digital simulations indicate that under somewhat rarer circumstances the same junction system can sustain a purely deterministic hopping between two unstable subharmonic modes, accompanied by excess low-frequency noise. Unlike the noise-induced case, this chaotic process occurs over a much narrower range in bias current and is destroyed by the addition of thermal noise. The differential equation describing the junction system can be reduced to a one-dimensional mapping in the vicinity of one of the unstable modes. A general analytical calculation of switching processes for a class of mappings yields the frequency dependence of the noise spectrum in terms of the parameters of the mapping. Finally, the concepts of noise-induced hopping near bifurcation thresholds are applied to the problem of the three-photon Josephson parametric amplifier. Analog simulations indicate that the noise rise observed in experimental devices arises from occasional hopping between a mode at the pump frequency ..omega../sub p/ and a mode at the half harmonic ..omega../sub p//2. The hopping is induced by thermal noise associated with the shunt resistance. 71 references.