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Abstract
Magnetoresistance skewness effect (change of the principal directions of electrical resistivity) appears when a magnetic field of arbitrary direction is applied on the examined material. This effect is useful for the magnetoresistance coefficients determination. A complete investigation of the skewness effect requires additional experimental facilities, such as the rotation of the sample and the contact system, which in some cases are impossible or very difficult to obtain. In this work the importance of the (110) and (111) planes of cubic crystals for such measurements is shown. For this purpose the elements of the resistivity tensor in the systems of reference, used in these planes, are correlated with those in the basic system of the (001) plane.
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