Abstract
Anomalous X-ray diffraction was used for the investigation of shape and chemical composition of self-organized PbSe quantum dots covered by PbEuTe capping layers. From reciprocal-space maps of diffracted intensities measured at two energies of the primary radiation, we discriminated the contributions of the dot volumes and the surrounding crystal lattice to the diffracted intensity. We have found that the presence of Eu atoms suppresses the flattening of the dots during their overgrowth.
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