Abstract
The study investigates alterations in surface morphology of microcrystalline diamond (MCD) film under reciprocating sliding test conditions. The MCD film was grown by microwave plasma enhanced chemical vapor deposition (MW-PECVD) on (100)-oriented Si wafer. The surface morphology was characterized by optical microscopy, scanning electron microscopy (SEM), atomic force microscopy (AFM) and mechanical profilometry. The formation of ripples on the wear scar surfaces was observed. The normalized wear rate (mm3/mN) of diamond film was evaluated using different approaches in order to understand the influence of diamond film deflection to wear.
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