Abstract
This study is an experimental investigation of the effects of radiation on conductivity of metal-dielectric-metal (MDM) and metal-dielectric-semiconductor (MDS) structures. A brief theoretical analysis of current flow mechanisms in the dielectric layer of an MDS structure is given. A physical interpretation of the experimental results obtained is offered. It is shown that the change in conductivity of MDM and MDS structures upon irradiation is dependent on the type of dielectric film used and the type of radiation.
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