Change Volmer–Weber to Frank–van der Merwe growth model of epitaxial BiVO4 film

Abstract

A continuous bismuth vanadate (BiVO4) thin film is necessary for the study of physical properties. In previous studies, it grows in the Volmer–Weber model, and shows the island morphology. Here, we realize the change of growth model from the Volmer–Weber to the Frank–van der Merwe growth model by selecting the different substrates during the preparation via magnetron sputtering method. The BiVO4 thin films on strontium titanate (STO (100)) substrate and yttrium stabilized zirconia (YSZ (001)) substrate was grown in in Frank–van der Merwe model and Volmer–Weber model, respectively. The BiVO4 thin films on STO (100) and YSZ (001) is oriented on (h00) and (0k0) of monoclinic structure.