Abstract
The effective thermal resistance (Rthe) of a light-emitting diode (LED) is determined to be the residual thermal resistance (Rthr) multiplied by (1−η) where η is the optical efficiency. We investigated the change in Rthe for 24mil and 35mil LEDs according to an input current change of up to 700mA using a transient thermal method with a thermal resistance tester (Metasystem™). Both the 24mil and 35mil LEDs showed a bimodal dependency of Rthe on the input current level. A 35mil LED showed a smaller Rthe value and a relatively smaller rate of increase of Rthe for an input current level over 100mA. To elucidate these results, Rthr, η, and the external quantum efficiency (EQE) were investigated.
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