Abstract
X-ray diffraction contrast tomography (DCT) is a near-field diffraction imaging technique to characterize the 3D shape and crystallographic orientation of grains within polycrystalline samples. The presence of orientation relationships as such encountered between Σ3n annealing twins found in Cu and Ni lead to systematic diffraction spot overlap, since a significant fraction of the lattice planes is shared between the parent and twin crystal lattices. If not correctly addressed, these overlaps will lead to artifacts in the individual grain reconstruction. In this paper we introduce a strategy for joint, tomographic reconstruction of Twin Related Domains (TRD) and cost function weights into DCT to improve the grain reconstruction quality. A large-grained polycrystalline sample made from pure Ni is used for testing this approach and its ability to reveal intragranular orientation gradients related to plastic strain localization at the onset of plastic deformation in this type of materials.
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More From: IOP Conference Series: Materials Science and Engineering
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