Abstract
Abstract Using a proton microbeam proton-induced X-ray emission (PIXE) and RBS, a formation of local surface segregations of Al in an Fe layer, has been found for the first time at an initial stage of high-dose intensive implantation (from 8×10 16 to 2×10 17 cm −2 dose irradiation). Using a slow positron beam, a profile of vacancy defects, whose depth is comparable with a depth profile of Al ions implanted into Fe with 5×10 17 cm −2 dose implantation, has been measured. The revealed regions with a local surface segregation of Al turned out to be partially amorphized after 2×10 17 cm −2 dose irradiation, according to conversion electron Mossbauer spectra (CEMS) measurements.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
