Abstract
Abstract X-ray photoelectron spectroscopy and X-ray absorption near edge spectroscopy experiments are used to investigate the oxidation state of cerium ions in ceria nanoparticles. A comparison of results shows that XPS yields a higher concentration of Ce3+ ions, even after analysis with a core–shell model. Three factors are proposed for the discrepancy between results: surface reduction of ceria in the XPS vacuum chamber enhanced by X-ray radiation, fast reduction dynamics associated with ceria nanoparticles, and a diffuse depth profile of the Ce3+ concentration inside ceria particles. Our results suggest that the high-vacuum XPS studies of ceria have overestimated the Ce3+ concentration in ceria nanoparticles under ambient condition. More importantly, we have demonstrated the importance of using complimentary surface analysis techniques to investigate the valence state of ceria nanoparticles.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
