Abstract
The application of the Conversion Electron Mossbauer Spectroscopy (CEMS) to the structural and magnetic analysis of ultrathin films and their interfaces is reported. Fe(110) films were deposited on W(110) under UHV conditions and analyzed in situ using CEMS. The changes ofBhf from layer to layer across the film are discussed with respect to the modifications of magnetic properties caused both by the finite film thickness and by the specific electronic structure of the interfaces.
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