Abstract
Presents a new strategy for parallel testing of RAM. A cellular automata (CA) based test pattern generator for detecting pattern sensitive faults (PSFs) in random access memories is also reported. An eight-cell one dimensional three neighbourhood CA has been extended to the five-neighbourhood case preserving the criterion of local connections. By changing the neighbourhood relation, all the 64 patterns for detecting the five-neighbourhood PSFs can be generated by loading two seeds only. The method can be easily extended for detecting PSFs of any neighbourhood.
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