Abstract
The formation of submicrometer voids within Ce(DBM) 3Phen doped poly(methyl methacrylate)(PMMA) was reported under multiphoton absorption excited by an infrared laser beam. The absorption spectra, photoluminescence and electron spin resonance (ESR) spectra before and after femtosecond laser irradiation were discussed. An ultrashort-pulsed laser beam with a pulse width of 200 femtosecond at a wavelength of 800 nm was focused into doped PMMA. The large changes in refractive index and the fluorescence associated with a void allowed conventional optical microscopy and reflection-type confocal microscopy to be used as detection methods. Voids could be arranged in a three-dimensional multilayered structure for high-density optical data storage. The separation of adjacent bits and layers were 4 and 16 μm, respectively.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
