Abstract
Yttrium pyrosilicate (Y2Si2O7) single crystals are successfully grown by the floating-zone method with 0.5–10.0% of Ce-doping concentration. X-ray diffraction patterns indicate a single phase of Y2Si2O7 without the impurity phase. The series photoluminescence (PL) and scintillation properties are systematically explored in this study, including PL emission, PL decay time, X-ray induced scintillation spectra, X-ray induced scintillation decay time, afterglow profile, and pulse height spectra. Ce-doped Y2Si2O7 is presented interesting properties including the intense emission band at 390 nm from Ce3+ 5d-4f transition on both PL emission contour maps as well as X-ray-induced scintillation spectra in all samples. The afterglow level at 20 ms after X-ray irradiation of the Ce-doped YPS is comparable with commercial scintillators such as CdWO4 and Tl-doped CsI. Under 137Cs (662 keV) γ-ray irradiation 137Cs (662 keV), the highest scintillation light yield of Ce-doped Y2Si2O7 is reach up to 17,200 ph/MeV for 2.0% Ce-doped sample.
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