Abstract
CdZnTe single crystals grown with the traveling heater method have been specifically engineered to support high-flux x-ray photon counting applications. Pixelated detector devices absorb hardened $120~\mathrm {kV}_{\mathrm {p}}$ fluxes up to $10^{8}~\mathrm {photons}/(\mathrm {mm}^{2.}\mathrm {sec})$ without any sign of electric field polarization at room temperature (23-28) °C. It is shown that detector functionality can be verified using photon counting electronics even under conditions of strong pulse pile-up. A non-paralyzable counting model satisfactory describes the average output count rate of the detector-electronics system as a function of the absorbed flux. Good pixel-to-pixel count rate uniformity can be achieved.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
