Abstract
A multichannel X-ray imaging sensor using a CdTe compound semiconductor radiation detector was developed. Both the digital X-ray imaging and energy-information-generating analyzing method were studied. The X-ray imaging sensor consisted of 512-channel CdTe detector elements at a pitch of 0.2 mm. X-ray photons were directly detected using a photon-counting method and high- and low-energy images were obtained simultaneously. The specific resolution was obtained over 2.5 line pairs/mm in the channel direction and 1.6 line pairs/mm in the scanning direction with a scanning pitch of 0.2 mm. The energy subtraction method was found to be effective in distinguishing an object's component materials.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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