Abstract
Characteristics and manufacturing methods of semiconductor detectors made of pressed cadmium telluride are given. The sensitivity of the detectors is ∼(1–5) × 10−19 A cm2 s/quantum. SPPD29k and SPPD29-02 detectors are calibrated by subnanosecond X-ray pulses generated by the СПИН-2 accelerator. The measured pulse durations are τ0.5 = 0.29 and 0.47 ns, respectively. The X-ray pulse shape of the APCA accelerator is recorded.
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