Abstract
Abstract Particle induced X-ray emission (PIXE) is a powerful technique for quantitative analysis because it is non-destructive, multi-elemental (from Na to U), highly sensitive and requires no special sample preparation. Heavy Ions PIXE (HI-PIXE), may represent a further step in versatility but it comes with added complexity of the physical processes involved in X-ray production, which require among other things new software capabilities. In this work, the specific capacities of the DT2 code are used to simulate and fit Ta L- and M-shell spectra obtained during the irradiation of a Ta2O5 thin film deposited upon a polished vitreous graphite substrate, produced in the frame of the Heavy Ions PIXE workpakage of the IAEA Coordinated Research Project F11019 on analytical uses of MeV focused ion beams. Proton and oxygen beams from a duoplasmatron ion source were used, and spectra were collected using both the CdTe and the X-ray Microcalorimeter Spectrometer detectors of the High Resolution High X-ray Energy PIXE (HRHE-PIXE) facility of C2TN. Results obtained from the simulation and the fitting of these spectra are presented and discussed.
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