Abstract
Thin films of transparent conductingn-type cadmium oxide have been deposited on glass substrates by a modified reactive thermal evaporation technique. X-ray diffraction (XRD) and X-ray fluorescence analysis confirm that the films are cadmium oxide. XRD also reveals that the 250 °C annealed films are polycrystalline with a preferred orientation along the (111) diffraction plane. The lattice parameter was found to be 4.961 A. The films show a high optical transmittance (70–92%) in the visible and near-infrared regions of the electromagnetic spectrum. A direct bandgap value of 2.45 ± 0.05 eV has been obtained for the CdO film. The room temperature resistivity, carrier concentration and mobility were determined as 1.45 × 10-3 Ω cm, 7.35 × 1019 cm-3 and 59.77 cm2/V s, respectively.
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